Low-threshold-current-density 1300-nm dilute-nitride quantum well lasers
Identifieur interne : 00DE26 ( Main/Repository ); précédent : 00DE25; suivant : 00DE27Low-threshold-current-density 1300-nm dilute-nitride quantum well lasers
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Abstract
Metalorganic chemical vapor deposition-grown In0.4Ga0.6As0.995N0.005 quantum well (QW) lasers have been realized, at an emission wavelength of 1.295 μm, with threshold and transparency current densities as low as 211 A/cm2 (for L=2000 μm) and 75 A/cm2, respectively. The utilization of a tensile-strained GaAs0.67P0.33 buffer layer and GaAs0.85P0.15 barrier layers allows a highly-compressively-strained In0.4Ga0.6As0.995N0.005 QW to be grown on a high-Al-content lower cladding layer, resulting in devices with high current injection efficiency (ηinj∼97%). © 2002 American Institute of Physics.
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<front><div type="abstract" xml:lang="en">Metalorganic chemical vapor deposition-grown In<sub>0.4</sub>
Ga<sub>0.6</sub>
As<sub>0.995</sub>
N<sub>0.005</sub>
quantum well (QW) lasers have been realized, at an emission wavelength of 1.295 μm, with threshold and transparency current densities as low as 211 A/cm<sup>2</sup>
(for L=2000 μm) and 75 A/cm<sup>2</sup>
, respectively. The utilization of a tensile-strained GaAs<sub>0.67</sub>
P<sub>0.33</sub>
buffer layer and GaAs<sub>0.85</sub>
P<sub>0.15</sub>
barrier layers allows a highly-compressively-strained In<sub>0.4</sub>
Ga<sub>0.6</sub>
As<sub>0.995</sub>
N<sub>0.005</sub>
QW to be grown on a high-Al-content lower cladding layer, resulting in devices with high current injection efficiency (η<sub>inj</sub>
∼97%). © 2002 American Institute of Physics.</div>
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Ga<sub>0.6</sub>
As<sub>0.995</sub>
N<sub>0.005</sub>
quantum well (QW) lasers have been realized, at an emission wavelength of 1.295 μm, with threshold and transparency current densities as low as 211 A/cm<sup>2</sup>
(for L=2000 μm) and 75 A/cm<sup>2</sup>
, respectively. The utilization of a tensile-strained GaAs<sub>0.67</sub>
P<sub>0.33</sub>
buffer layer and GaAs<sub>0.85</sub>
P<sub>0.15</sub>
barrier layers allows a highly-compressively-strained In<sub>0.4</sub>
Ga<sub>0.6</sub>
As<sub>0.995</sub>
N<sub>0.005</sub>
QW to be grown on a high-Al-content lower cladding layer, resulting in devices with high current injection efficiency (η<sub>inj</sub>
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